Author Type

Graduate Student

Date of Award

2011

Document Type

Thesis

Publication Status

Version of Record

Submission Date

October 2026

Abstract

Computer simulations of the growth of binary alloy thin films in two and three dimensions were performed using an extension of the Solid on Solid model. Snapshots for a range of interactions and diffusion rates are presented and critically compared to experiment. A wide variety of distinct phases is identified and their growth conditions analyzed. These findings are summarized in a phase diagram. In addition, a fractal analysis of the domains is performed. It is found that for negative interactions the islands are two-dimensional, while for positive interactions, regardless of diffusion rate, a fractal dimension of 1.78 is obtained.

Extent

xv, 149 p. : ill. (some col.)

Comments

by Mark R. Bouwens.|Thesis (Ph.D.)--Florida Atlantic University, 2011.|Includes bibliography.|Electronic reproduction. Boca Raton, Fla., 2011. Mode of access: World Wide Web.|by Mark R. Bouwens.

Identifier

FADT3174504

Format

pdf

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