Date of Award
2001
Document Type
Thesis
Publication Status
Version of Record
Submission Date
October 2026
Thesis/Dissertation Advisor [Chair]
Tsai, Chi-Tay
Abstract
The objective of this work is to perform the current induce thermal stress analysis of heterojunction bipolar transistor and to determine the implications of the variation of the thermal shunt thickness. A thesis presented on multi-physics using finite element analysis, covering fluid, thermal and stress with fatigue life analysis of a microelectronic heterojunction bipolar transistor.
Extent
196 p.
Recommended Citation
Rivero, Jose Fernando, "Thermal and stress analysis of heterojunction bipolar transistor" (2001). Electronic Theses and Dissertations 2000 - 2009. 320.
https://digitalcommons.fau.edu/etd_general_5/320
Identifier
FADT12834
Format
COinS
Comments
College of Engineering and Computer Science|FAU Electronic Theses and Dissertations Collection|Thesis (M.S.)--Florida Atlantic University, 2001.|College of Engineering and Computer Science