Author Type

Graduate Student

Date of Award

1994

Document Type

Thesis

Publication Status

Version of Record

Submission Date

October 2026

Thesis/Dissertation Advisor [Chair]

Mazuera, Olga

Abstract

Fault simulators can be used for various purposes, such as the determination of the Fault coverage, the Automatic test pattern generation and the preparation of the Fault dictionaries. As the size of the digital circuits increases, the number of gates present increases and the time taken for fault simulation also increases. In order to reduce the fault simulation time, massively parallel computers are being used. We have developed a fault simulator on MASPAR, a massively parallel Single Instruction Multiple Data machine, based on the principles of parallel pattern parallel fault simulation. In order to eliminate the limitation of limited memory on MASPAR, we have designed an algorithm which reduces the amount of memory required for storing the circuit. We have implemented these algorithms in two different ways. These algorithms were tested on ISCAS85 benchmark circuits. The results have shown an improvement over other parallel algorithms.

Extent

91 p.

Comments

College of Engineering and Computer Science|FAU Electronic Theses and Dissertations Collection|Thesis (M.S.C.E.)--Florida Atlantic University, 1994.|College of Engineering and Computer Science

Identifier

FADT15050

Format

pdf

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