Date of Award
1987
Document Type
Thesis
Publication Status
Version of Record
Submission Date
October 2026
Thesis/Dissertation Advisor [Chair]
Fernandez, Eduardo B.
Abstract
A great deal of research in the area of VLSI built-in testability is under way. This approach increases the reliability of the hardware system at the gate or circuit level. However, in many cases we cannot modify an existing hardware, and diagnostic software is a possible way to increase reliability. We use here a strategy to apply diagnostic tests that consist of starting of single units and instructions, to include progressively more complex instructions and units. After a complete processor is shown to be correct, it can be used to test other processors in a multiprocessing system. We present here details of this approach, including self-test software and its application to the Intel 8086 microprocessor.
Extent
153 p.
Recommended Citation
Yazdani, Hamid R., "Diagnosis of microprocessors using self-test and its application to multiprocessing" (1987). Electronic Theses and Dissertations 1980 - 1989. 522.
https://digitalcommons.fau.edu/etd_general_3/522
Identifier
FADT14426
Comments
College of Engineering and Computer Science|Thesis (M.S.)--Florida Atlantic University, 1987.|FAU Electronic Theses and Dissertations Collection|College of Engineering and Computer Science