Date of Award
1986
Document Type
Thesis
Publication Status
Version of Record
Submission Date
October 2026
Thesis/Dissertation Advisor [Chair]
Graham, Peter
Abstract
There is an increasing market demand for quartz crystals which exhibit minimal activity dip or frequency anomalies over a predefined temperature range. Characterization of the frequency vs temperature (f-T) activity dip profiles of these tight tolerance crystals is best carried out using a system which has been expressly designed for such a purpose. Frequency measurement accuracy and reliable temperature control must be established in the system, along with its being compatible with a computer controlled production or engineering enviornment. This thesis will present design and implementation details for a system with the aformentioned objective of enabling the generation of accurate crystal activity dip data. The system will provide the user with up-to-date facilities for meeting the temperature testing requirements of tight tolerance crystals.
Extent
156 p.
Recommended Citation
Peterson, Vance Howard, "PRECISION TC SYSTEM FOR MEASURING ACTIVITY DIPS OF QUARTZ CRYSTALS" (1986). Electronic Theses and Dissertations 1980 - 1989. 479.
https://digitalcommons.fau.edu/etd_general_3/479
Identifier
FADT14343
Comments
College of Engineering and Computer Science|Thesis (M.S.E.)--Florida Atlantic University, 1986.|FAU Electronic Theses and Dissertations Collection|College of Engineering and Computer Science