Author Type

Graduate Student

Date of Award

1978

Document Type

Thesis

Publication Status

Version of Record

Submission Date

October 2026

Thesis/Dissertation Advisor [Chair]

Messenger, Roger A.

Abstract

A survey of MOS RAM failure modes describes those failures that a complete MOS RAM testing program accelerates and identifies. Functional testers perform the identification while burn-in testers accelerate various failure modes. A dynamic burn-in system that includes temperature, bias, and operational signal stress has been designed so that a large number of MOS RAM modules are stressed during a burn-in cycle. The system requires flexible hardware and software configurations and an almost universal product interface. Since these requirements have been met and the characteristics of the stress signals are similar to those encountered by the product during a normal lifetime, the dynamic burn-in system presented in this study can effectively accelerate the most prominent MOS RAM failure modes.

Extent

113 p.

Comments

College of Engineering and Computer Science|Thesis (M.S.E.)--Florida Atlantic University, 1978.|FAU Electronic Theses and Dissertations Collection|College of Engineering and Computer Science

Identifier

FADT13901

Format

pdf

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